Scanning electron microscopy (SEM)
Scanning electron microscope JSM-U3, JEOL, Japan.
X-ray photoelectron and Auger spectroscopy
High resolution electrons energy losses spectroscopy (EMU-50 source of monochromatic low energy electrons: primary electrons energy E0 = 0 — 100 eV, half-width of back scattered electrons line 17 meV) (HREELS)
Secondary ions mass-spectroscopy (SIMS)
Samples preparation in the preparation chamber of the spectrometer
Electron spectrometer ESCALAB MK2, Vacuum Generators, UK;
hemispherical energy analyser with 17 meV resolution.
SPRG team carries out researches in various branches of physics and chemistry:
Metals, Semiconductor nanomaterials for micro- and optoelectronic devices, Nanocharacterization, Oxides,
Modelling of physical processes,
Thin films and coatings,
The main results are presented in our papers. See Publications part.
SPRG scientists are expanding their skills participating in international expositions, conferences, seminars presenting most important scientific results.